ligitek electronics co.,ltd. property of ligitek only LVG13741-PF data sheet doc. no : qw0905-LVG13741-PF rev : a date : 19 - dec. - 2006 super bright round type led lamps pb lead-free parts
page 1/5 package dimensions part no. LVG13741-PF ligitek electronics co.,ltd. property of ligitek only 5.0 5.9 8.6 7.6 0.5 typ 2.54typ directivity radiation note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 1.0min 1.5max 25.0min + -
unit mw ma ma pd i fp i f 120 100 30 ratings vg parameter power dissipation forward current peak forward current duty 1/10@10khz absolute maximum ratings at ta=25 symbol a ir tstg t opr -40 ~ +100 -40 ~ +85 10 storage temperature operating temperature reverse current @5v typical electrical & optical characteristics (ta=25 ) ligitek electronics co.,ltd. property of ligitek only page 2/5 luminous intensity @20ma(mcd) 56 90 50 2.6 max. min. typ. spectral halfwidth nm peak wave length pnm 30 565 forward voltage @20ma(v) min. 1.7 material green gap emitted LVG13741-PF part no note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. lens color viewing angle 2 1/2 (deg) part no. LVG13741-PF green transparent
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 fig.4 relative intensity vs. temperature ambient temperature( ) r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage f o r w a r d c u r r e n t ( m a ) forward current(ma) fig.2 relative intensity vs. forward current r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0101001000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40-200204060 1.0 1.1 1.2 500550600650 0.0 0.5 1.0 2.03.04.05.0 80100 0.8 0.9 -20 -4040 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 vg chip 3.5 page 3/5 part no. LVG13741-PF
note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. part no. LVG13741-PF 60 seconds max preheat 25 0 0 2 /sec max 50 100 120 260 temp( c) 260 c3sec max 5 /sec max time(sec) 150 ligitek electronics co.,ltd. property of ligitek only soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) 2.wave soldering profile dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) page 4/5
part no. LVG13741-PF this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 solderability test this test intended to see soldering well performed or not. 1.t.sol=230 5 2.dwell time=5 1sec mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 reliability test: the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. solder resistance test thermal shock test high temperature high humidity test low temperature storage test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. 1.t.sol=260 5 2.dwell time= 10 1sec. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles the purpose of this test is the resistance of the device under tropical for hours. 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) operating life test high temperature storage test test item this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) test condition description mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202:103b jis c 7021: b-11 jis c 7021: b-12 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only page 5/5
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